The Sector Measurements WITE32 test module with the Sector Sweep test varies one of the system parameters (such as off-track offset or clock), performs one or several WITE32 standard measurements listed the Table 1, and reports measurement results per sector. Each measurement has dedicated preconditioning setup. This feature combined with the ability to sweep almost any system parameter allows this test to execute the algorithms of most WITE32 profile-style tests, such as Track Profile, Saturation, MR Saturation, Frequency, Off-track Performance, and report results per sector.

The integrated graphical result display allows for convenient observation of one or several crosscuts of the three-dimensional result data, see Figure 1.

All raw results may be exported to a text file in CSV format for custom processing.

illustration of data selection for graphical display

Figure 1: Illustration of data selection for graphical display: crosscut along sweep parameter axis

Measurement	Measurement Results	Required Hardware
Parametric	TAA Positive / Negative PW Positive / Negative (for longitudinal recording) Rise / Fall Time (for perpendicular recording) Modulation Positive / Negative Timing Asymmetry Amplitude Asymmetry	WDM5044 or D5000
SNR	SNR (wideband signal-to-noise ratio) Signal Amplitude or RMS Noise RMS	WDM5044 or D5000
DFT	Signal Harmonic Amplitudes for specified frequencies	WDM5044
Overwrite	Overwrite Original Signal Harmonic Amplitude Residual Signal Harmonic Amplitude	WDM5044
PES	Position Error Signal (PES) Invalid Sector Count	V2002 or DTR3000 spinstand
Spectral SNR	Spectral SNR Signal Amplitude Noise RMS	WDM5044
BER	Bit Error Rate Byte Error Rate Bit Error Count Byte Error Count Byte Count	CAI4K-compatible PRML chip adapter or D5000

Sector Measurements Test Module

Figure 1: Illustration of data selection for graphical display: crosscut along sweep parameter axis

Table 1: List of supported sector measurements